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A key difference to LEED is that the electrons strike the sample at grazing angles (0.1 – 5 °). RHEED is used for determining the surface crystal structure, but it can also be used to monitor the growth mode and deposition rate of films. Reflection High-Energy Electron Diffraction (RHEED) Common uses of electron diffraction are low-energy electron diffraction (LEED), reflection high-energy electron diffraction (RHEED), electron diffraction in transmission electron microscopy (TEM, involving several different diffraction modes), and electron backscatter diffraction (EBSD, often used with Scanning Electron Microscopy). They can be classified based on the energy or the application. Modern electron diffraction has split into a large variety of distinct techniques. This strong interaction limits the electrons ability to penetrate further than a few atomic layers into the sample, resulting in good surface sensitivity. Electron diffraction is like X-ray diffraction in principle, but unlike X-rays, electrons have strong electrostatic interactions with matter. The first diffraction patterns using electrons were aquired in 1927, only three years after de Broglie's discovery of the wave nature of matter. Electron diffraction is a common tool for analyzing the surface structures of crystalline materials.